Robust phase correction techniques for terahertz time-domain reflection spectroscopy

Basic Information

• Paper ID: 2412.18662
• Title: Robust phase correction techniques for terahertz time-domain reflection spectroscopy
• Authors: Kasturie D. Jatkar, Tien-Tien Yeh, Matteo Pancaldi, Stefano Bonetti
• Classification: physics.optics, cond-mat.other
• Publication Date: December 31, 2024 (arXiv v2)
• Paper Link: https://arxiv.org/abs/2412.18662

Abstract

This paper presents a systematic approach implementing two robust methods for phase correction in terahertz time-domain spectroscopy (THz-TDS) measurements in reflection geometry. By combining Kramers-Kronig relations with precise experimental measurements of terahertz electric field amplitude, the authors demonstrate how to retrieve correct electric field phase under conditions of partial misalignment. The technique enables accurate estimation of optical properties for virtually any material exhibiting reflected terahertz radiation, with method validation through extraction of the complex refractive index of InSb. The technique is applicable to arbitrary angles of incidence and polarization states.

Research Background and Motivation

Problem Definition

Terahertz time-domain spectroscopy (THz-TDS) in reflection geometry configuration faces severe phase sensitivity issues. Phase measurements are highly susceptible to relative position offsets between the sample and reference mirror; even minor positional errors produce significant errors in results, increasing post-processing complexity for data extraction.

Importance Analysis

1. Broad Applicability: THz spectroscopy has widespread applications in solid-state physics, chemistry, biology, pharmaceuticals, and security screening
2. Material Limitations: Most materials exhibit low transmittance in the THz regime, necessitating reflection geometry measurements
3. Technical Challenges: Reflection geometry measurements demand extremely high sample positioning precision; existing methods typically require complex iterative calculations or known "anchor points"

Limitations of Existing Methods

• Maximum entropy method (MEM), single-subtraction and multi-subtraction Kramers-Kronig methods require extensive iterative calculations
• Existing innovative experimental techniques are often material-specific, lacking generality
• Phase correction accuracy is limited, affecting the precision of optical parameter extraction

Core Contributions

1. Systematic Phase Correction Method: Two robust phase correction techniques based on Kramers-Kronig relations
2. Misalignment Problem Resolution: Recovery of correct phase information from arbitrary sample position offsets
3. Generality Verification: Applicability to arbitrary angles of incidence, polarization states, and material types
4. Sub-micrometer Precision: Achievement of sub-micrometer position offset detection accuracy (two orders of magnitude smaller than THz wavelength)
5. Experimental Validation: Method verification through complex refractive index extraction of InSb

Methodology Details

Task Definition

Input: Time-domain data from sample and reference signals obtained via reflection geometry THz-TDS measurements Output: Corrected phase information and accurate material optical parameters (complex refractive index, dielectric constant, etc.) Constraints: Handling phase errors induced by sample position misalignment

Theoretical Foundation

Phase Misalignment Model

The measured phase can be expressed as:

φₘ(ω) = φᵢ(ω) + (ω/c) × (2l/cos θ)

where φᵢ is the intrinsic material phase, l is the sample position offset, and θ is the angle of incidence.

Kramers-Kronig Relation Application

Employing the inverted form of the Kramers-Kronig relation:

ln|r̃(ω)/r̃(ω')| = (2/π)P∫₀^∞ [Ωφ(Ω)/(Ω²-ω²) - Ωφ(Ω)/(Ω²-ω'²)]dΩ

Two Correction Methods

Method One: Analytical Fitting Approach

Through derivation, an analytical function is obtained:

Δₘ(ω) = (2lω/πc cos θ)ln|(ωₑₙd-ω)/(ωₑₙd+ω)| + C + C'

where Δₘ is a quantity calculated from measured phase and reflection coefficient; position offset l is obtained through function fitting.

Method Two: Experimental Minimization Technique

By minimizing the difference between calculated and measured reflection coefficient magnitudes:

min_l (∫₀^ωₑₙd ||r̃calc(Ω)| - |r̃ₘ(Ω)||dΩ)

Technical Innovations

1. Theoretical Breakthrough: Proof that the misalignment term's contribution to the Kramers-Kronig relation vanishes over infinite integration range
2. Finite Frequency Band Processing: Derivation of analytical expressions for misalignment terms applicable to practical finite-band measurements
3. Robustness Design: Two complementary correction methods provide mutual verification mechanisms
4. High-Precision Implementation: Sub-micrometer position detection accuracy

Experimental Setup

Experimental Apparatus

• THz System: TeraFlash Pro photoconductive antenna system
• Temporal Resolution: 0.05 ps
• Scan Range: 70 ps
• Geometric Configuration: Normal incidence (silicon beamsplitter) and 45° incidence (off-axis parabolic mirror)

Sample Stage Design

• Bilinear translation stage and dual-axis goniometer system
• Piezoelectric translation stage for precision positioning perpendicular to sample surface
• Motor-controlled translation stage for sample-reference cyclic measurements

Test Materials

InSb Single Crystal: A semiconductor material exhibiting strong plasma resonance in the low-THz frequency band, suitable for method validation

Measurement Parameters

• Polarization States: s-polarization and p-polarization
• Position Offsets: 0 μm, 10 μm, 100 μm
• Frequency Range: 0-4 THz
• Angles of Incidence: Normal incidence and 45° incidence

Experimental Results

Primary Results

Position Offset Detection Accuracy

InSb Optical Parameter Extraction

Parameters obtained through Drude model fitting:

• Normal Incidence: ε∞ = 18.16, ωₚ/2π = 2.005 THz, γ/2π = 0.26 THz
• 45° Incidence (s-polarization): ε∞ = 23.05, ωₚ/2π = 1.98 THz, γ/2π = 0.29 THz
• 45° Incidence (p-polarization): ε∞ = 20.45, ωₚ/2π = 1.98 THz, γ/2π = 0.24 THz

Method Comparison and Verification

Direct vs. Inverted Kramers-Kronig Relations

Comparative analysis demonstrates that the inverted form of the Kramers-Kronig relation is more robust over finite frequency bands, maintaining phase extraction accuracy across different cutoff frequencies.

Consistency Between Two Correction Methods

Position offset values obtained from analytical fitting and experimental minimization methods show high consistency, with relative errors below 1%, validating method reliability.

Experimental Findings

1. Sub-micrometer Precision: Achievement of 0.2-0.5 μm position detection accuracy, two orders of magnitude smaller than THz wavelength (300 μm @ 1 THz)
2. Angle Independence: Method demonstrates excellent performance across different angles of incidence
3. Polarization Independence: Consistent results for s-polarization and p-polarization measurements
4. Large Offset Applicability: Accurate correction maintained even under 100 μm large offset conditions

Related Work

Existing Phase Correction Techniques

• Maximum Entropy Method (MEM): Requires repeated iterations with high computational complexity
• Subtraction Kramers-Kronig Methods: SSKK, MSKK, DMSKK, etc., require known anchor points
• Innovative Experimental Techniques: Through-substrate reflection spectroscopy, etc., with limited applicability

Advantages of This Work

1. Generality: Applicable to arbitrary materials, angles of incidence, and polarization states
2. Robustness: No iterative calculations or prior knowledge required
3. Precision: Sub-micrometer correction accuracy achieved
4. Practicality: Two complementary implementation methods provided

Conclusions and Discussion

Main Conclusions

1. Theoretical Contribution: Establishment of systematic phase correction theoretical framework based on Kramers-Kronig relations
2. Method Validity: Both correction methods accurately detect and correct sample position misalignment
3. Application Value: Significant simplification of data processing workflows for reflection geometry THz-TDS
4. Universality: Method applicability across various experimental configurations and material types

Limitations

1. Frequency Band Constraints: Method based on finite-band Kramers-Kronig relations; measured frequency band must adequately encompass material's primary spectral features
2. Large Offset Limitations: For large offsets causing focal point changes, three-dimensional light propagation modeling may be necessary
3. Material Assumptions: Assumption that φ₀ = 0 holds for insulators and metals; modifications may be needed for other materials

Future Directions

1. Extended Applications: Application of method to broader categories of quantum material research
2. Algorithm Optimization: Further precision improvement based on material-specific knowledge
3. Complex Models: Integration with more sophisticated Kramers-Kronig relations for specialized materials

In-Depth Evaluation

Strengths

1. Theoretical Rigor: Complete mathematical derivation grounded in Kramers-Kronig relations
2. Comprehensive Experimental Validation: Method effectiveness verified across multiple configurations and materials
3. High Practical Value: Resolution of critical technical challenges in THz reflection spectroscopy
4. Strong Innovation: First achievement of sub-micrometer-level THz spectroscopy phase correction

Weaknesses

1. Theoretical Approximations: Approximation errors exist in finite-band Kramers-Kronig relations
2. Material Dependence: Method precision may depend on material spectral characteristics
3. Experimental Complexity: Requires precision experimental apparatus and rigorous alignment procedures

Impact

1. Academic Contribution: Important methodological breakthrough for THz spectroscopy
2. Application Prospects: Will promote widespread adoption of reflection geometry THz-TDS in materials science
3. Technology Transfer: Potential to become standard correction algorithm for commercial THz spectrometers

Applicable Scenarios

1. Quantum Material Research: THz spectroscopy measurements of opaque materials such as metals and superconductors
2. Industrial Inspection: Quality control applications requiring high-precision THz reflection measurements
3. Fundamental Research: Precision spectroscopy of low-energy excitations (phonons, magnons, etc.)

References

This paper cites 37 relevant references covering theoretical foundations, experimental techniques, and applications in THz spectroscopy. Key references include:

• Optical applications of Kramers-Kronig relations 31-36
• Phase correction techniques for THz time-domain spectroscopy 18-24
• Experimental methods for reflection geometry THz measurements 25-29

Overall Assessment: This is a high-quality optical technology paper presenting a systematic approach to resolving the critical technical challenge of phase correction in THz reflection spectroscopy. The theoretical derivations are rigorous, experimental validation is comprehensive, and the work possesses significant academic value and application prospects.