Transferable Parasitic Estimation via Graph Contrastive Learning and Label Rebalancing in AMS Circuits

Basic Information

• Paper ID: 2507.06535
• Title: Transferable Parasitic Estimation via Graph Contrastive Learning and Label Rebalancing in AMS Circuits
• Authors: Shan Shen, Shenglu Hua, Jiajun Zou, Jiawei Liu, Jianwang Zhai, Chuan Shi, Wenjian Yu
• Classification: cs.LG cs.SY eess.SY
• Submission Date: October 10, 2025 (arXiv submission)
• Paper Link: https://arxiv.org/abs/2507.06535

Abstract

This paper proposes the CircuitGCL framework to address parasitic parameter estimation in analog-mixed-signal (AMS) circuits. The framework tackles challenges arising from scarce circuit design data, imbalanced label distributions, and circuit implementation diversity through graph contrastive learning and label rebalancing techniques. CircuitGCL employs a self-supervised strategy to learn topology-invariant node embeddings through representation scattering on hyperspheres, while introducing balanced mean squared error (BMSE) and balanced softmax cross-entropy (BSCE) loss functions to mitigate label distribution discrepancies across circuits. Experiments on TSMC 28nm AMS designs demonstrate that the method achieves R² improvements of 33.64%–44.20% on edge regression tasks and F1-score improvements of 0.9×–2.1× on node classification tasks.

Research Background and Motivation

Problem Definition

Modern AMS circuits integrate analog modules (such as amplifiers and oscillators) and digital subsystems (such as controllers and SRAM arrays), requiring extensive manual iterations during design. As process nodes continue to shrink, parasitic effects become increasingly critical, particularly parasitic capacitance, which significantly impacts circuit performance by increasing propagation delay, raising power consumption, and degrading signal integrity.

Research Significance

Traditional design flows rely on post-layout simulation to verify parasitic effects, a time-consuming and costly approach. Parasitic parameter prediction at the pre-layout stage can substantially reduce design iteration cycles and improve design efficiency. Graph neural networks (GNNs) provide an effective solution by modeling circuits as graph structures for parasitic parameter prediction.

Limitations of Existing Methods

1. Data Scarcity: High-quality AMS circuit data (including SPICE netlists and post-layout parasitic parameters) is typically proprietary and expensive to generate
2. Circuit Diversity: AMS circuits span analog, digital, and mixed-signal domains with different design principles and performance requirements
3. Label Imbalance: Parasitic capacitance distributions exhibit long-tail characteristics with severe underrepresentation of large capacitance values
4. Poor Transferability: Existing methods trained on specific circuit types struggle to generalize to other circuit topologies

Core Contributions

1. CircuitGCL Framework: Adapts representation scattering mechanism (RSM) to graph contrastive learning, generating transferable representations directly applicable to unseen AMS designs without task-specific fine-tuning
2. Label Rebalancing Techniques: Addresses data imbalance in circuit datasets through balanced MSE and balanced BSCE loss functions, enhancing cross-domain transfer capability
3. Unified Theoretical Framework: Provides unified theoretical foundations for imbalanced regression and classification based on distribution alignment principles
4. Broad Applicability: The method extends directly to resistance/inductance prediction, crosstalk analysis, IR drop estimation, and cross-process migration tasks

Methodology Details

Task Definition

Input: Schematic netlists of AMS circuits, modeled as heterogeneous graphs G = (V, E), where nodes V represent nets, transistor devices, and pins, and edges E encode connectivity relationships Output:

• Edge regression task: Predict coupling capacitance values
• Node classification task: Classify ground capacitance into discrete ranges (small/medium/large)

Model Architecture

1. Graph Transformation Module

Converts heterogeneous AMS graphs to homogeneous graphs, using node type attributes X ∈ {0,1,2}^{N×1} to distinguish net, device, and pin nodes. Enhanced feature matrix X_C ∈ R^{N×d_C} captures detailed design parameters and connectivity statistics.

2. Representation Scattering Mechanism (RSM)

Definition: In D-dimensional embedding space R^D, RSM enforces two constraints:

• Center-away constraint: Node embeddings maximize separation from scattering center c
• Uniformity constraint: Node embeddings distribute uniformly on subspace S_k

Implementation:

h̃_i = h_i / max(||h_i||_2, ε)  # L2 normalization
L_scattering = -1/N ∑||h̃_i - c||²_2  # Scattering loss
c = 1/N ∑h̃_i  # Scattering center

3. Online Encoder

Target encoder generates scattering representations H_target = f_φ(A,X), while online encoder produces intermediate representations H_online, obtaining predicted representations z_online through predictor q_θ(·). Alignment loss is:

L_alignment = -1/N ∑(z_i^T h_i)/(||z_i||_2 ||h_i||_2)

Target encoder parameters are updated via exponential moving average: φ ← τφ + (1-τ)θ

Technical Innovations

1. Advantages over DSPD

CircuitGPS uses dual-anchor shortest path distance (DSPD) for positional encoding, but computational and storage costs scale quadratically with graph size. CircuitGCL's GCL pretraining exhibits high parallelism and good model scalability, significantly outperforming DSPD on large-scale circuits.

2. Label Rebalancing Theoretical Foundation

Based on Bayes' theorem, the relationship between training distribution p_train(y|x) and balanced distribution p_bal(y|x) is:

p_train(y|x)/p_bal(y|x) ∝ p_train(y)/p_bal(y)

Experimental Setup

Dataset

Six AMS circuit designs implemented in TSMC 28nm CMOS technology:

• Training Set: SSRAM (87K nodes, 134K edges)
• Test Sets: DIGITAL CLK GEN, TIMING CTRL, ARRAY 128 32, ULTRA8T, SANDWICH-RAM
• Maximum design contains 4.3M nodes and 13.3M edges

Evaluation Metrics

• Regression Tasks: MAE, MSE, R²
• Classification Tasks: Accuracy, Precision, Recall, F1-score

Baseline Methods

1. ParaGraph: MPNN-based ensemble model
2. DLPL-Cap: Multi-expert GNN regressor
3. CircuitGPS: Few-shot learning method with positional encoding

Implementation Details

• Encoder: 4-layer ClusterGCN, 256 hidden dimensions, Tanh activation, 0.3 dropout
• Downstream GNN: 5-layer GraphSAGE, 144 hidden dimensions, PReLU activation
• σ_noise = 0.001, τ = 0.99

Experimental Results

Main Results

Edge Regression Task (Coupling Capacitance Estimation)

Node Classification Task (Ground Capacitance Classification)

Ablation Studies

RSM Effect Analysis

RSM demonstrates performance improvements across all datasets:

• Maximum R² improvement of 26.9% (ARRAY 128 32)
• Maximum F1 improvement of 20.0% (ULTRA8T)
• Minimum improvements of 4.1% (F1) and 6.56% (R²)

Label Rebalancing Effects

BSCE application to all baseline methods yields significant accuracy improvements, with more pronounced effects on large-scale designs. Balanced MSE significantly enhances model performance in data-scarce regions.

Related Work

Parasitic Parameter Prediction

• ParaGraph: Converts circuit schematics to graphs, uses MPNN to predict net capacitance and layout parameters
• DLPL-Cap: Combines GNN router with five expert regressors to handle imbalanced data distribution in SRAM circuits
• CircuitGPS: Employs few-shot learning and low-cost positional encoding for parasitic parameter prediction

Graph Contrastive Learning

Mainstream GCL frameworks implicitly perform representation scattering, which is critical to their success. This work adopts SGRL as the GCL foundation, embedding node representations on hyperspheres.

Imbalanced Learning

• Classification: Data resampling, loss reweighting, logit adjustment methods
• Regression: Relatively underexplored, existing methods primarily involve SMOTE adaptation and loss reweighting

Conclusions and Discussion

Main Conclusions

1. CircuitGCL successfully addresses data scarcity and label imbalance in AMS circuit design through self-supervised representation learning and distribution-aware loss functions
2. RSM-generated topology-invariant embeddings demonstrate excellent cross-domain transfer capability
3. Balanced loss functions theoretically unify imbalanced regression and classification problems
4. Achieves state-of-the-art performance on multiple TSMC 28nm designs

Limitations

1. Validation only on TSMC 28nm process; cross-process node migration capability requires further verification
2. Currently focuses on capacitance prediction; applicability to resistance/inductance prediction needs further investigation
3. Computational efficiency for large-scale circuits remains room for optimization

Future Directions

1. Extension to broader AMS circuit types
2. Adaptation to parasitic resistance estimation
3. Integration into RC-aware place-and-route tools
4. Cross-process node transfer learning research

In-Depth Evaluation

Strengths

1. Problem Importance: Addresses practical pain points in the EDA field with significant engineering value
2. Method Innovation: First application of graph contrastive learning to circuit parasitic parameter prediction with clever RSM adaptation
3. Theoretical Contribution: Provides unified theoretical framework for imbalanced regression and classification
4. Comprehensive Experiments: Validation on multiple real circuit designs with convincing results
5. Reproducibility: Open-source code provided for easy reproduction and application

Weaknesses

1. Dataset Limitations: Uses only single-process-node data; generalization capability requires verification
2. Computational Overhead: Although more efficient than DSPD, GCL pretraining still requires additional computational resources
3. Feature Engineering: Circuit feature extraction and representation still rely on manual design
4. Theoretical Analysis: Lacks in-depth theoretical analysis of why RSM is particularly suited for circuit graphs

Impact

1. Academic Value: Opens up applications of graph contrastive learning in the EDA field, potentially inspiring related research
2. Engineering Value: Directly applicable to commercial EDA tools, improving design efficiency
3. Method Generality: Framework extends to other parasitic parameter prediction and circuit analysis tasks

Applicable Scenarios

1. Pre-layout Stage: Rapid parasitic effect assessment, reducing design iterations
2. Design Space Exploration: Quick screening of candidate solutions in large design spaces
3. Cross-design Transfer: Applying models trained on one circuit to new circuit designs
4. EDA Tool Integration: Core algorithm module for commercial EDA tools

Overall Assessment: This is a high-quality interdisciplinary research paper that successfully applies cutting-edge machine learning techniques to practical EDA problems. The methodology is novel, experiments are comprehensive, results are significant, and it possesses important theoretical and practical value.