Open and Collaborative Science for Developing an Automated Test Bench for Characterizing Switching Losses by Opposition Method

Basic Information

• Paper ID: 2510.09725
• Title: Open and Collaborative Science for Developing an Automated Test Bench for Characterizing Switching Losses by Opposition Method
• Authors: Nicolas Rouger, Luiz Villa, Matthieu Masson, Pauline Kergus, Joseph Kemdeng, Lorenzo Leijnen, Jean Alinei, Adrien Colomb, Ayoub Farah-Hassan, Arnauld Biganzoli
• Classification: physics.ed-ph cs.SY eess.SY
• Conference: SYMPOSIUM DE GENIE ELECTRIQUE (SGE 2025), 1-3 JULY 2025, TOULOUSE, FRANCE
• Paper Link: https://arxiv.org/abs/2510.09725

Abstract

Switching losses in power transistors are typically measured using the double-pulse method. Opposition measurement of two switching units represents a complementary approach that is more precise but indirect. However, implementing this method can be more complex, requiring calibration steps and comprehensive control, along with thermal management challenges. In this context, the authors address this problem through open and collaborative science, first via a two-day hackathon followed by monthly open meetings. Over 20 participants contributed to the two-day hackathon, with subsequent monthly meetings for those wishing to continue collaboration. This enabled the development of an automated test bench using open science methodology, encompassing switching command generation, measurement instrument configuration and control, and hardware components.

Research Background and Motivation

Core Problem

Accurate measurement of switching losses in power transistors is a critical technical challenge in power electronics. While the traditional double-pulse measurement method is widely used, it has limitations in accuracy. The opposition method, as a more precise measurement approach, measures average power loss through the opposition operation of two switching units.

Problem Significance

1. Accuracy Requirements: With the development of wide-bandgap semiconductors such as SiC and GaN, switching speeds continue to increase, demanding higher measurement accuracy and temporal resolution, requiring nanosecond-level timing control.
2. Thermal Management Challenges: The opposition method requires devices to operate continuously at rated power, generating self-heating effects that must be completed quickly to avoid temperature drift.
3. Technical Complexity: Implementing an automated opposition method test bench requires integration of multiple technical domains including instrument control, signal generation, and power hardware.

Limitations of Existing Methods

• The double-pulse method has limited accuracy, particularly for fast-switching devices.
• While the opposition method is precise, its implementation is complex, lacking standardized automated test solutions.
• Existing implementations typically require deep knowledge across multiple specialized domains, presenting challenges particularly for researchers and doctoral students.

Research Motivation

The authors adopt an innovative approach using open collaborative science, bringing together multi-disciplinary experts through hackathons and monthly meetings to solve this complex technical problem, with all results shared in open-source form.

Core Contributions

1. Developed a complete automated opposition method test bench: Including comprehensive solutions for hardware design, instrument control, and signal generation.
2. Implemented a Python supervisory control system: Automatically controlling multiple measurement instruments via SCPI protocol, enabling synchronized measurements.
3. Constructed a high-precision signal generation system: Based on the OwnTech SPIN controller, achieving nanosecond-level timing control with up to 5.4GHz clock frequency.
4. Provided a complete open-source solution: All code and designs released under GPL v3 license.
5. Validated the collaborative science model: Successfully implemented a complex technical system development through a hackathon with 20+ participants.

Methodology Details

Task Definition

Develop a fully automated power transistor switching loss measurement system capable of:

• Automatically configuring and controlling measurement instruments
• Generating precisely synchronized switching control signals
• Implementing fast and accurate power loss measurements
• Minimizing measurement time to reduce thermal effects

System Architecture

The system comprises three major components:

1. Supervisory Control and Instrument Management

• Python Supervisory Program: Responsible for automating the entire test procedure.
• Instrument Configuration: Controlling via PyVISA and SCPI protocol:
  • DC Power Supply: Progressive voltage rise, stabilization, and shutdown
  • Digital Multimeter: Measuring average DC current and voltage
  • Oscilloscope: Fast waveform acquisition using segmented storage
• Synchronization Mechanism: Using hardware synchronization signals to trigger all measurements, avoiding communication delays.

2. Signal Generation System

Implementing two test modes based on the OwnTech SPIN controller:

• Phase Difference Mode: Fixed duty cycle with varying phase difference between two units
• Duty Cycle Difference Mode: Zero phase difference with varying duty cycle difference between two units

3. Power Hardware Platform

• Using Infineon EVAL-1ED3122Mx12H evaluation board
• Containing isolated driver half-bridge switching units
• Supporting 600V/20A power rating
• Verified using 200V/20A silicon MOSFETs

Technical Innovations

1. Multi-Instrument Synchronized Measurement: Achieving precise synchronization of multiple measurement instruments through hardware synchronization signals, eliminating communication delay effects.
2. Adaptive Measurement Time Control: Finding optimal balance between measurement accuracy and thermal effects.
3. JSON Configuration File System: Enabling flexible test parameter configuration and experimental design.
4. Nanosecond-Level Timing Control: Utilizing 5.4GHz clock for high-precision dead-time control.

Experimental Setup

Hardware Configuration

• Power Device: 200V/20A Silicon MOSFET (TO-247-3 package)
• Evaluation Board: Infineon EVAL-1ED3122Mx12H
• Inductance: 50μH
• Controller: OwnTech SPIN (5.4GHz clock)

Test Parameter Range

• DC Bus Voltage: 30V - 60V
• Switching Frequency: 50kHz - 80kHz
• Peak Current: 0.5A - 3A
• Dead Time: 300ns
• Measurement Time: 1ms - 20ms

Evaluation Metrics

• Switching loss energy (E_off, E_on)
• Average power loss
• Measurement accuracy and repeatability
• System automation level

Experimental Results

Main Results

1. System Functionality Verification

Successfully implemented a fully automated test procedure:

• Automatic test configuration file generation
• Automatic control of all measurement instruments
• Automatic multi-parameter scanning tests
• Automatic data acquisition and preliminary processing

2. Switching Loss Measurement Results

Successfully extracted turn-off loss energy within the 30V-50V bus voltage range:

• E_off vs I_peak Relationship: Within the 0.5A-1.5A current range, turn-off loss increases from 0.2μJ to 1.0μJ
• Voltage Dependency: Switching losses increase significantly at higher bus voltages
• Measurement Consistency: Multiple measurements demonstrate good repeatability

3. Waveform Quality Analysis

Obtained high-quality voltage and current waveforms:

• Clear switching transient processes
• Precise dead-time control
• Good signal synchronization

Case Analysis

Typical Operating Point Test

• Parameters: 60V bus voltage, 80kHz switching frequency, 3A peak current
• Results: Successfully captured complete switching transient process, validating the effectiveness of the opposition method

Automatic Scanning Test

Implemented automatic scanning across multi-dimensional parameter space:

• Voltage Scanning: 30V, 40V, 50V
• Current Scanning: 0.5A - 1.5A (5 points)
• Automatic extraction of switching losses at each operating point

Experimental Findings

1. Thermal Effects Impact: LTspice electro-thermal simulation revealed that 200ms test time causes significant junction temperature rise.
2. Measurement Accuracy Trade-off: Optimal balance needed between measurement accuracy and test time.
3. System Stability: Automated system demonstrates stable and reliable performance during extended operation.

Related Work

Development History of Opposition Method

1. Forest et al. (2006): First systematically proposed opposition method for testing large-scale power electronic converters.
2. Brandelero et al. (2013): Applied opposition method to non-intrusive switching loss measurement of GaN power transistors.
3. Sathler & Cougo (2017): Improved opposition method to enhance switching energy estimation accuracy for wide-bandgap transistors.
4. Nguyen Tien et al. (2023): Developed semiconductor loss estimation instrument based on opposition method.

Advantages Compared to Related Work

1. Complete Automation: First to achieve end-to-end automation from signal generation to data processing.
2. Open Source and Open Access: All designs and code completely open-source, promoting technology dissemination.
3. Multi-Parameter Optimization: Simultaneously considering measurement accuracy, speed, and thermal management.
4. Innovative Collaboration Model: Achieving cross-disciplinary technical integration through hackathon methodology.

Conclusions and Discussion

Main Conclusions

1. Successfully developed a complete automated opposition method test bench, validating the effectiveness of open collaborative science model.
2. Achieved nanosecond-level timing control and multi-instrument synchronized measurement, meeting modern power device testing requirements.
3. Provided standardized solutions for the power electronics testing field through open-source approach.

Limitations

1. Thermal Management: Current version cannot fully address self-heating effects on measurement accuracy.
2. Power Rating Limitations: Verification conducted only at medium power levels (200V/20A); high-power applications require further validation.
3. Calibration Automation: Lacks automatic calibration functionality for circuit parameters (inductance, resistance).
4. Safety Mechanisms: Lacks automatic safety protection for abnormal situations such as communication failures.

Future Directions

1. Thermally Optimized Test Sequences: Develop intelligent test sequences considering thermal effects.
2. Automatic Calibration System: Implement automatic identification and calibration of circuit parameters.
3. Extended Power Range: Adapt to higher power ratings and different device packages.
4. Database Construction: Establish open device characteristic database.
5. Accuracy Analysis: Conduct systematic accuracy comparison with other measurement methods.

In-Depth Evaluation

Strengths

Technical Innovation

1. System Integration Innovation: First to completely integrate instrument control, signal generation, and power hardware into an automated system.
2. Timing Control Precision: Nanosecond-level control achieved with 5.4GHz clock represents state-of-the-art in this field.
3. Synchronized Measurement Solution: Hardware synchronization triggering resolves timing consistency issues in multi-instrument measurement.

Methodological Contributions

1. Open Science Practice: Demonstrates new model for complex technical system development.
2. Cross-Disciplinary Collaboration: Successfully integrates multiple professional domains including instrumentation, control, and power electronics.
3. Knowledge Dissemination: Open-source approach lowers technical barriers, facilitating technology adoption.

Practical Value

1. Ready-to-Use: Provides complete usable test solution.
2. Scalability: Modular design facilitates adaptation to different application requirements.
3. Educational Value: Provides high-quality resources for teaching and training in related fields.

Shortcomings

Technical Limitations

1. Incomplete Thermal Management: Electro-thermal simulation reveals significant thermal effects, but lacks effective real-time thermal management strategies.
2. Limited Power Range: Verification only on medium-power devices; applicability to high-power applications remains uncertain.
3. Insufficient Accuracy Analysis: Lacks quantitative accuracy comparison with standard methods.

Experimental Design

1. Single Device Type: Primarily verified using silicon MOSFETs; verification on SiC/GaN devices is insufficient.
2. Long-Term Stability: Lacks reliability verification for extended operation.
3. Extreme Condition Testing: Does not address testing under extreme conditions such as high temperature and high frequency.

System Completeness

1. Missing Safety Mechanisms: Lacks comprehensive fault detection and protection mechanisms.
2. Simple User Interface: GUI functionality is relatively basic; user experience requires improvement.
3. Insufficient Documentation: Technical documentation completeness and usability need enhancement.

Impact

Academic Value

1. Methodological Contribution: Provides important reference for standardization of power electronics testing.
2. Collaboration Model Demonstration: Open science practice offers valuable experience for other fields.
3. Technology Advancement: Promotes application of automated testing technology in power electronics field.

Practical Impact

1. Industrial Application Potential: Directly applicable to product testing by power device manufacturers.
2. Educational Promotion: Provides high-quality teaching and research tools for universities and research institutions.
3. Standardization Promotion: Facilitates establishment of industry testing standards and specifications.

Technical Ecosystem

1. Open-Source Ecosystem Development: Contributes important resources to power electronics open-source community.
2. Cross-Disciplinary Integration: Promotes deep fusion of testing measurement and power electronics technology.
3. Talent Cultivation: Provides practical platform for talent development in related fields.

Applicable Scenarios

1. Device Manufacturers: Product development and quality control of power semiconductor devices.
2. Research Institutions: Research projects and academic research in power electronics.
3. Educational Institutions: Experimental teaching and project practice in power electronics courses.
4. Testing Services: Standardized testing services by third-party testing organizations.

References

1. Brandelero, J., et al. "A non-intrusive method for measuring switching losses of gan power transistors." IECON 2013.
2. Forest, F., et al. "Use of the Opposition Method in the Test of High Power Electronics Converters." IEEE Transactions on Industrial Electronics, 2006.
3. Sathler, H., & Cougo, B. "Improvement of the modified opposition method used for accurate switching energy estimation of wbg transistors." IEEE WiPDA, 2017.
4. GitHub Repository: https://github.com/owntech-foundation/test_bench_code

Overall Assessment: This is a paper of significant practical value and methodological innovation. Through open collaborative approaches, the authors successfully addressed complex technical challenges, not only providing complete technical solutions but more importantly demonstrating a new scientific collaboration model. Despite room for improvement in certain technical details, its open-source philosophy and cross-disciplinary collaborative practice make important contributions to the development of related fields.