Polarization dependency in Resonant Inelastic X-Ray Scattering
Tagliavini, Wenzel, Haverkort
Resonant Inelastic X-Ray Scattering (RIXS) is a well-established tool for probing excitations in a wide range of materials. The measured spectra strongly depend on the scattering geometry, via its influence on the polarization of the incoming and outgoing light. By employing a tensor representation of the 4-point response function that governs the RIXS intensity, we disentangle the experimental geometry from the intrinsic material properties. In dipole-dipole RIXS processes and low-symmetry crystals, up to 81 linearly independent fundamental spectra can be measured as a function of light polarization. However, for crystals or molecules with symmetry, the number of independent fundamental spectra that define the RIXS tensor is significantly reduced.
This work presents a systematic framework for determining the number of fundamental spectra and expressing the RIXS tensor in terms of these fundamental components. Given a specific experimental geometry, the measured spectrum can be represented as a linear combination of these fundamental spectra. To validate our approach, we performed calculations for different point group symmetries, both with and without an applied magnetic field. Within the same framework, we derived expressions for powder spectra in momentum-independent processes and spectra obtained using Bragg spectrometers. This formalism provides a valuable toolkit for optimizing experiment planning, data interpretation, and RIXS simulation.
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Polarization Dependency in Resonant Inelastic X-Ray Scattering
This paper presents a systematic theoretical framework for understanding polarization dependence in Resonant Inelastic X-Ray Scattering (RIXS). By employing tensor representation of four-point response functions, the authors successfully separate experimental geometric configurations from intrinsic material properties. In dipole-dipole RIXS processes and low-symmetry crystals, up to 81 linearly independent fundamental spectra can be measured as functions of photon polarization. However, for crystals or molecules with symmetry, the number of independent fundamental spectra defining the RIXS tensor is significantly reduced. This work provides a systematic framework for determining the number of fundamental spectra and expressing the RIXS tensor in terms of these fundamental components.
RIXS is a powerful spectroscopic technique capable of probing local electronic states, spin states, valence orbital occupancy, and low-energy excitations in materials. Over the past two decades, RIXS has flourished with improved radiation source brightness and experimental resolution, becoming an essential tool for studying a wide range of material systems.
Complex Polarization Dependence: RIXS spectra strongly depend on scattering geometry, particularly on the polarization states of incident and scattered light, complicating spectral interpretation
Lack of Systematic Framework: Although the Kramers-Heisenberg equation and light-matter interaction theory are well-established, systematic methods to separate experimental geometry from intrinsic material properties are lacking
Difficulty in Intuitive Understanding: Atomic multiplets involving strong Coulomb interactions and spin-orbit coupling are often difficult to interpret
The core motivation of this work is to establish a theoretical framework analogous to the electro-optic tensor in nonlinear optics, systematizing the polarization dependence of RIXS and providing valuable tools for experimental planning, data interpretation, and RIXS simulations.
Proposed Systematic Representation of RIXS Tensor: Represented the four-point response function as a 9×9 tensor, successfully separating experimental geometry from material properties
Established Symmetry Analysis Framework: Utilized point group symmetry to determine non-zero tensor elements, significantly simplifying analysis for materials with different symmetries
Developed Spherical Tensor Coupling Method: Coupled polarization vectors as spherical tensor bases with l=0,1,2, facilitating symmetry analysis
Provided Solutions for Multiple Experimental Configurations: Including unpolarized analysis, powder sample averaging, and Bragg analyzer effects for practical experimental scenarios
Verified Theoretical Framework: Performed numerical calculations for different point group symmetries using the Quanty software
This paper cites 87 important references covering RIXS experimental technique development, theoretical methods, and related applications. Particularly noteworthy are:
Classical works on the Kramers-Heisenberg equation
Foundational literature on atomic multiplet theory
Recent advances in RIXS technology and applications
Theoretical foundations of group theory and tensor analysis
Overall Assessment: This is a high-quality theoretical physics paper providing important methodological contributions to RIXS spectroscopy. The theoretical framework is complete and rigorous, with outstanding practical value, and will have a positive impact on the development of this field.