We present the methodology and results of the on-sky responsivity calibration of the South Pole Telescope Shirokoff Line Intensity Mapper (SPT-SLIM). SPT-SLIM is a pathfinder line intensity mapping experiment utilizing the on-chip spectrometer technology, and was first deployed during the 2024-2025 Austral Summer season on the South Pole Telescope. During the two-week on-sky operation of SPT-SLIM, we performed periodic measurements of the detector response as a function of the telescope elevation angle. Combining these data with atmospheric opacity measurements from an on-site atmospheric tipping radiometer, simulated South Pole atmospheric spectra, and measured detector spectral responses, we construct estimates for the responsivity of SPT-SLIM detectors to sky loading. We then use this model to calibrate observations of the moon taken by SPT-SLIM, cross-checking the result against the known brightness temperature of the Moon as a function of its phase.
This paper presents the on-sky responsivity calibration methodology and results for the Shirokoff Line Intensity Mapper (SPT-SLIM) deployed on the South Pole Telescope. SPT-SLIM is a pioneering line intensity mapping experiment utilizing on-chip spectrometer technology, first deployed on the South Pole Telescope during the 2024-2025 Antarctic summer season. During a two-week observing campaign, the research team regularly measured the detector response as a function of telescope elevation angle. By combining in-situ atmospheric opacity measurements, simulated Antarctic atmospheric spectra, and measured detector spectral responses, the team constructed an estimation model for SPT-SLIM detector responsivity to sky loading. This model was subsequently used to calibrate SPT-SLIM lunar observations through cross-validation with known lunar phase function brightness temperatures.
As a novel on-chip spectrometer experiment, SPT-SLIM requires the establishment of accurate detector calibration methods to convert the frequency shift response of microwave kinetic inductance detectors (MKIDs) into effective brightness temperature. This forms the foundation for scientific observations and data analysis.
Technology Verification Requirements: As the first deployed on-chip spectrometer line intensity mapping experiment, its on-sky performance must be validated
Calibration Challenges: Traditional fixed-temperature calibration sources failed during initial commissioning, necessitating alternative calibration methods
Scientific Applications: Accurate calibration is prerequisite for extracting celestial spectral information and conducting cosmological studies
Traditional millimeter-wave telescopes typically employ fixed-temperature calibration sources; however, SPT-SLIM's fixed-temperature calibrator malfunctioned during initial commissioning and became unavailable. Therefore, an alternative calibration method based on atmospheric loading was required.
To develop a reliable atmospheric calibration method that not only addresses current calibration requirements but also provides calibration strategy reference for future similar on-chip spectrometer experiments.
Detector bandpass measured using Fourier Transform Spectrometer (FTS), with Lorentzian peak function obtained through optical path difference domain interferogram fitting:
I(z)=e−σ0πz/Rcos(2πσ0z)
where z is optical path difference, σ0 is peak wavenumber, and R is spectral resolution.
By varying the sidelobe contribution parameter α in the model, the necessity of sidelobe modeling was verified. Models without sidelobe correction failed to adequately fit observations at different elevation angles.
This paper cites 15 important references covering SPT-SLIM system design, MKID technology, atmospheric modeling, lunar brightness temperature, and other related fields, providing solid theoretical and technical foundation for the research.
Overall Assessment: This is a high-quality instrumentation science paper that demonstrates innovative problem-solving in the face of technical challenges. While certain modeling assumptions and precision limitations exist, it provides valuable engineering experience and calibration methodology for emerging on-chip spectrometer technology, possessing significant technical value and scientific importance.